| Standard Number : |
Official Title of Standard |
|
| IEC60319:1999 |
Presentation and specification of reliability data for electronic components |
| IEC60397:1994 |
Test methods for batch furnaces with metallic heating resistors |
| IEC60404-1:2000 |
Magnetic materials. Classification |
| IEC60489-2:1991 |
Radio equipment used in mobile services. Methods of measurement. Transmitters employing A3E, F3E or G3E emissions |
| IEC60489-6:1999 |
Radio equipment used in mobile services. Methods of measurement. Data equipment |
| IEC60532:1992 |
Radiation protection instrumentation. Installed dose ratemeters, warning assemblies and monitors. X and gamma radiation of energy between 50 keV and 7 MeV |
| IEC60533:1999 |
Electrical and electronic installations in ships. Electromagnetic compatibility |
| IEC60605-4:2001 |
Equipment reliability testing. Statistical procedures for exponential distribution. Point estimates, confidence intervals, prediction intervals and tolerance intervals |
| IEC60605-6:1997 |
Equipment reliability testing. Tests for the validity of the constant failure rate or constant failure intensity assumptions |
| IEC60609-2:1997 |
Cavitation pitting evaluation in hydraulic turbines, storage pumps and pump turbines. Evaluation in Pelton turbines |
| IEC60692:1999 |
Nuclear instrumentation. Density gauges utilizing ionizing radiation. Definitions and test methods |
| IEC60709:2004 |
Nuclear power plants. Instrumentation and control systems important to safety. Separation |
| IEC60736:1982 |
Testing equipment for electrical energy meters |
| IEC60747-12-1:1995 |
Discrete semiconductor devices and integrated circuits. Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fibre optic systems and sub-systems |
| IEC60747-12-3:1998 |
Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Blank detail specification for light-emitting diodes (LEDs) for display applications |
| IEC60747-14-1:2000 |
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. General and classification. Sensor generals and classification for semiconductor sensors |
| IEC60747-14-2:2000 |
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. Hall elements |
| IEC60747-14-3:2001 |
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. Pressure sensors |
| IEC60747-16-2:2001 |
Discrete semiconductor devices and integrated circuits. Microwave integrated circuits. Microwave integrated circuits. Frequency prescalers |
| IEC60747-2:2000 |
Discrete semiconductor devices and integrated circuits. Rectifier diodes |
| IEC60747-4-1:2000 |
Microwave diodes and transistors. Microwave field effect transistors. Blank detail specification. BDS for microwave field-effect transistors |
| IEC60747-4-2:2000 |
Semiconductor devices. Discrete devices. Microwave diodes and transistors. Integrated-circuit microwave amplifiers. Blank detail specification |
| IEC60747-6:2000 |
Discrete semiconductor devices and integrated circuits. Thyristors |
| IEC60747-7:2000 |
Discrete semiconductor devices and integrated circuits. Bipolar transistors |
| IEC60747-8:2000 |
Discrete semiconductor devices and integrated circuits. Field-effect transistors. Additional ratings and characteristics and amds in the measuring methods for power switching field effect transistors |
